Assume a 15 cm diameter wafer has a cost of 12, contains 84 dies, and has 0.020 defects/cm2. Assume a 20 cm diameter wafer has a cost of 15, contains 100 dies, and has 0.031 defects/cm2.a. Find the yield for both wafers. b. Find the cost per good die for both wafers. c. If the number of dies per wafer is increased by 10% and the defects per area unit increases by 15% find the die area and yield. d. Assume a fabrication process improves the yield from 0.92 to 0.95. Find the defects per area unit for each version of the technology given a die area of 200 mm2