Components used in a cellular telephone are manufactured with nominal dimension of 0.3 mm and lower and upper specification limits of 0.295 mm and 0.305 mm respectively. The x and r control charts for this process are based on subgroups of size 3 and they exhibit statistical control, with the center line on the x chart at 0.3015 mm and the center line on the r chart at 0.00154 mm. Required:
a. Estimate the mean and standard deviation of this process.
b. Suppose that parts below the LSL can be reworked, but parts above the USL must be scrapped. Estimate the proportion of scrap and rework produced by this process.
c. Suppose that the mean of this process can be reset by fairly simple adjustments. What value of the process mean would you recommend? Estimate the proportion of scrap and rework produced by the process at this new mean

rectangle that is ther answer you

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$9.41

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shift 4 units up, and 1 unit left.

it will translate f(x) = 3^x to g(x) = 3^(x+1) + 4

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we can use this expression to calculate the energy gain as a particle moves with a field or the energy loss as it moves against it. (note that it is also used to define the electron-volt, a unit of energy equal to that gained by an electron as it falls through a pd of 1 v, i.e. w = 1 ev = 1.6 10-19 c 1 v = 1.6 10-19j).in fact this expression is really nothing more than the statement that potential is the potential energy per unit charge. in this case, v= w/qis simply stating that the change in potential energy(or work done) per unit charge is equal to the change in potential (or potential difference), v.student questions: uniform electric fields2electron beamcathode+5 kvanode0 v