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Post Test: Congruence, Proof, and Constructions
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What needs to be corrected in this construction of a line parallel to AB passing through C?
IC
second arc (centered at E)
E
first arc (centered at D)
F
B
D
OA. The first arc should pass through C
R
Tha fet arr chand harantarar
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O

The fraction of defective integrated circuits produced in a photolithography process is being studied. a random sample of 300 circuits is tested, revealing 17 defectives. (a) calculate a 95% two-sided confidence interval on the fraction of defective circuits produced by this particular tool. round the answers to 4 decimal places. less-than-or-equal-to p less-than-or-equal-to (b) calculate a 95% upper confidence bound on the fraction of defective circuits. round the answer to 4 decimal places. p less-than-or-equal-to