A process engineer has defined the control limits for this process as three standard deviations above and below the mean, meaning that if a lot of measurements suddenly appear outside these limits, the process is out of control. Ideally, these control limits are within the product specification limits. For this product, the specification limits are 0.260 μm and 0.340 μm. If a width does not fall between these values, the chip fails testing and is destroyed. What are the control limits for this process?