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The fraction of defective integrated circuits produced in a photolithography process is being studied. a random sample of 300 circuits is tested, revealing 17 defectives. (a) calculate a 95% two-sided confidence interval on the fraction of defective circuits produced by this particular tool. round the answers to 4 decimal places. less-than-or-equal-to p less-than-or-equal-to (b) calculate a 95% upper confidence bound on the fraction of defective circuits. round the answer to 4 decimal places. p less-than-or-equal-to

3x = 729 solve for x plz . it's urgent. will mark

He letter p on the number line below represents the number . (use the hyphen for negative numbers and write answer as a decimal, such as –7.2) number line from negative 7 to positive 7 in increments of 0.5 is shown. only the whole numbers are labeled. a point labeled p is placed at the eleventh tick mark to the left of 0.