The fraction (i. e., proportion) of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives. (a) Calculate a 95% two-sided CI on the fraction of defective circuits produced by this process. (b) Calculate a 95% upper confidence bound on the fraction of defective circuits produced by this process.

Answer: d. 39 cmin the diagram, the approximate length of the minor arc de is 39 centimetres.step-by-step explanation: the formula for the length of an arc in a circle is as displayed below.let the length of the minor arc de = xx = 2( pi )r × angle of sector / 360°from this, we will substitute the values given from the problem into the formula to obtain the length of the minor arc de.x = 2( pi )r × angle of sector / 360°r = radius = 25cmpi as an approximate value = 3.14angle of sector = 120°x = 2( 3.14 )( 25 ) × 120° / 360°x = 157 × 1 / 4x = 39.25x = 39 ( rounded to the nearest whole number as an approximate value )