Mathematics, 06.11.2019 20:31 KillerMDFK7992
Abin of 5 transistors is known to contain 2 that are defective. the transistors are to be tested, one at a time, until the defective ones are identified. denote by n1 the number of tests made until the first defective is identified and by n2 the number of additional tests until the second defective is identified. find the joint probability mass function of n1 and n2.
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Abin of 5 transistors is known to contain 2 that are defective. the transistors are to be tested, on...
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