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The fraction of defective integrated circuits produced in a photolithography process is being studied. a random sample of 300 circuits is tested, revealing 17 defectives. (a) calculate a 95% two-sided confidence interval on the fraction of defective circuits produced by this particular tool. round the answers to 4 decimal places. less-than-or-equal-to p less-than-or-equal-to (b) calculate a 95% upper confidence bound on the fraction of defective circuits. round the answer to 4 decimal places. p less-than-or-equal-to

Afarm is to be built in the shape of quadrilateral abcd, as shown below. all four sides are equal. a rhombus abcd is shown with diagonal ac equal to 15.5 feet and diagonal bd equal to 13.2 feet. what is the area of the farm? pleas only pick from the 4 below 62 square feet 52.8 square feet 57.4 square feet 102.3 square feet

Evaluate 8x2 + 9x − 1 2x3 + 3x2 − 2x dx. solution since the degree of the numerator is less than the degree of the denominator, we don't need to divide. we factor the denominator as 2x3 + 3x2 − 2x = x(2x2 + 3x − 2) = x(2x − 1)(x + 2). since the denominator has three distinct linear factors, the partial fraction decomposition of the integrand has the form† 8x2 + 9x − 1 x(2x − 1)(x + 2) = correct: your answer is correct. to determine the values of a, b, and c, we multiply both sides of this equation by the product of the denominators, x(2x − 1)(x + 2), obtaining 8x2 + 9x − 1 = a correct: your answer is correct. (x + 2) + bx(x + 2) + cx(2x − 1).